Thoughtful delivery service

Easy 30 day returns

Certified Reviews

Description

XX-Large Bulk Specimen HolderDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain

7 Tip Radius (Nom): 10 Tip Radius (Max): 15 Tip Set Back (Nom): 15 Tip Set Back( RNG): 5 - 25 Tilt Compensation: 12

Can be sterilized with microwaves

All standards are carbon coated

Each wafer holder has two fixed clips

NanoIR calibration test sample mounted on ZnSe prism

nanoindentation

4 ohms/sq/mil (25µm)

Bar Width: 12 microns

not with transmitted electrons

20 and 25 gauge)

Click here for an example image of the high resolution capabilities of this probe

Width x Thickness 5388-8NM PELCO® Pro ESD Epoxy Coated